Please use this identifier to cite or link to this item:
http://172.22.28.37:8080/xmlui/handle/123456789/1423Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | MICHAEL, BHSHNELL | - |
| dc.contributor.author | VISHWANI, AGRAWAL | - |
| dc.date.accessioned | 2023-12-02T10:52:02Z | - |
| dc.date.available | 2023-12-02T10:52:02Z | - |
| dc.date.issued | 2002 | - |
| dc.identifier.isbn | 0306470340-3 | - |
| dc.identifier.uri | http://172.22.28.37:8080/xmlui/handle/123456789/1423 | - |
| dc.description | Essentials of Electronic Testing for Digital Memory & Mixed Signal VLSI Circuits | en_US |
| dc.description.abstract | Essentials of Electronic Testing for Digital Memory & Mixed Signal VLSI Circuits | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | KLUWER ACADEMICS | en_US |
| dc.title | ESSENTIALS OF ELECTRONIC TESTING | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Engineering Ebooks | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Essentials of Electronic Testing for Digital Memory & Mixed Signal VLSI Circuits.pdf | 42.87 MB | Adobe PDF | View/Open |
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